James Yip Editor at IgMin Research
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Biography
Dr. James Yip is an internationally recognized pathologist with extensive expertise in neurological and hematological disorders. He obtained his Master’s degree focusing on transplant immunology at the University of Western Ontario, Canada. He completed his MD degree at Wayne State University, where he contributed extensively to neuroprotection and vascular stroke research at the Department of Neurosurgery. He further completed a fellowship at Weill Cornell Medicine with subspecialization in hematologic
disorders.
Research Interest
T cells, NK cells, CNS neoplasms, hematolymphoid neoplasms
Editor
Work Details
Doctor
Weill Cornell Medicine
Department of Pathology and Laboratory Medicine
USA
Contribution by Topic Area
Why publish with us?
Global Visibility – Indexed in major databases
Fast Peer Review – Decision within 14–21 days
Open Access – Maximize readership and citation
Multidisciplinary Scope – Biology, Medicine and Engineering
Editorial Board Excellence – Global experts involved
University Library Indexing – Via OCLC
Permanent Archiving – CrossRef DOI
APC – Affordable APCs with discounts
Citation – High Citation Potential
Which articles are now trending?
Research Articles
- On how Doping with Atoms of Gadolinium and Scandium affects the Surface Structure of Silicon
- Integrated Multi-fidelity Structural Optimization for UAV Wings
- Investigation of Lateral Vibrations in Turbine-generator Unit 5 of the Inga 2 Hydroelectric Power Plant
- A Multi-Model Simulation Framework for Sponge Park Concept Achieving Urban Water Energy Nexus Sustainability in Hyper Arid Climates
- Prevalence of Diabetic Retinopathy among Self-reported Newly Diagnosed Diabetics
- Preparing for SpaceX Mission to Mars
