James Yip Editor at IgMin Research
Our vision is to promote the integration of scientific fields to hasten the discovery process.
Biography
Dr. James Yip is an internationally recognized pathologist with extensive expertise in neurological and hematological disorders. He obtained his Master’s degree focusing on transplant immunology at the University of Western Ontario, Canada. He completed his MD degree at Wayne State University, where he contributed extensively to neuroprotection and vascular stroke research at the Department of Neurosurgery. He further completed a fellowship at Weill Cornell Medicine with subspecialization in hematologic
disorders.
Research Interest
T cells, NK cells, CNS neoplasms, hematolymphoid neoplasms
Editor
Work Details
Doctor
Weill Cornell Medicine
Department of Pathology and Laboratory Medicine
USA
Contribution by Topic Area
Why publish with us?
Global Visibility – Indexed in major databases
Fast Peer Review – Decision within 14–21 days
Open Access – Maximize readership and citation
Multidisciplinary Scope – Biology, Medicine and Engineering
Editorial Board Excellence – Global experts involved
University Library Indexing – Via OCLC
Permanent Archiving – CrossRef DOI
APC – Affordable APCs with discounts
Citation – High Citation Potential
Which articles are now trending?
Research Articles
- Comparing Forecasting Models for Predicting Infant Mortality: VECM vs. VAR and BVAR Specifications
- Evaluating Digital Imaging Technologies for Anogenital Injury Documentation in Sexual Assault Cases
- Assessing Bee (Hymenoptera, Apoidea, Anthophila) Diversity and Floral Preference in Two Habitats in the Iberian Peninsula
- Trend of SO2 Gas Dry Deposition in Vietnam
- Microgravity Employment in Archaeology – Available Experience and Future Perspectives
- Efficient Room Temperature Ethanol Vapor Sensing by Unique Fractal Features of Tin Oxide
