James Yip Editor at IgMin Research
Our purpose is to inspire collaborative dialogue among scientific fields and foster accelerated knowledge development.
Biography
Dr. James Yip is an internationally recognized pathologist with extensive expertise in neurological and hematological disorders. He obtained his Master’s degree focusing on transplant immunology at the University of Western Ontario, Canada. He completed his MD degree at Wayne State University, where he contributed extensively to neuroprotection and vascular stroke research at the Department of Neurosurgery. He further completed a fellowship at Weill Cornell Medicine with subspecialization in hematologic
disorders.
Research Interest
T cells, NK cells, CNS neoplasms, hematolymphoid neoplasms
Editor
Work Details
Doctor
Weill Cornell Medicine
Department of Pathology and Laboratory Medicine
USA
Contribution by Topic Area
Why publish with us?
Global Visibility – Indexed in major databases
Fast Peer Review – Decision within 14–21 days
Open Access – Maximize readership and citation
Multidisciplinary Scope – Biology, Medicine and Engineering
Editorial Board Excellence – Global experts involved
University Library Indexing – Via OCLC
Permanent Archiving – CrossRef DOI
APC – Affordable APCs with discounts
Citation – High Citation Potential
Which articles are now trending?
Research Articles
- Assessment of Thermal Uniformity of Heating Plates Using a Thermal Imaging Camera
- Analysis of the State of Moisture Control to Ensure and Regulate the Quality of Grain and Grain Products
- Potentially Toxic Metals in Cucumber Cucumis sativus Collected from Peninsular Malaysia: A Human Health Risk Assessment
- Designing a Compact High-precision Positioner with Large Stroke Capability for Nanoindentation Devices
- A Comprehensive Methodology for Assessing the Business Reputation of Industrial and Production Personnel
- Efficacy of Alternative Insecticides against Dusky Cotton Bug (Oxycarenus laetus) to Improve Yield Losses in Cotton Crops through Residue-based Bioassay
