James Yip Editor at IgMin Research
Our goal is to promote cross-disciplinary communication and speed up the growth of knowledge in diverse scientific areas.
Biography
Dr. James Yip is an internationally recognized pathologist with extensive expertise in neurological and hematological disorders. He obtained his Master’s degree focusing on transplant immunology at the University of Western Ontario, Canada. He completed his MD degree at Wayne State University, where he contributed extensively to neuroprotection and vascular stroke research at the Department of Neurosurgery. He further completed a fellowship at Weill Cornell Medicine with subspecialization in hematologic
disorders.
Research Interest
T cells, NK cells, CNS neoplasms, hematolymphoid neoplasms
Editor
Work Details
Doctor
Weill Cornell Medicine
Department of Pathology and Laboratory Medicine
USA
Contribution by Topic Area
Why publish with us?
Global Visibility – Indexed in major databases
Fast Peer Review – Decision within 14–21 days
Open Access – Maximize readership and citation
Multidisciplinary Scope – Biology, Medicine and Engineering
Editorial Board Excellence – Global experts involved
University Library Indexing – Via OCLC
Permanent Archiving – CrossRef DOI
APC – Affordable APCs with discounts
Citation – High Citation Potential
Which articles are now trending?
Research Articles
- The Impact of Stress on Periodontal Health: A Biomarker-Based Review of Current Evidence
- Evaluating Digital Imaging Technologies for Anogenital Injury Documentation in Sexual Assault Cases
- Sorption-based Spectrophotometric Assay for Lead(II) with Immobilized Azo Ligand
- Development of a Mechanical Seal Closed Design Model
- Contribution to the Knowledge of Ground Beetles (Coleoptera: Carabidae) from Pakistan
- Prevalence of Diabetic Retinopathy among Self-reported Newly Diagnosed Diabetics
